Report date: Nov 6,2024
Conflict count: 361874
Publisher: Elsevier
Title count: 938
Conflict count: 15239


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Created: 2012-02-15 16:05:26
ConfID: 4821937
CauseID: 1348614055
OtherID: 1348584132
JT: Microelectronics Reliability
MD: ,6,2,202,1967,Resistivity and structure of sputtered molybdenum films
DOI: 10.1016/0026-2714(67)90237-5(Journal) (4821937-N)
DOI: 10.1016/0026-2714(67)90240-5(Journal)
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Created: 2012-02-15 15:53:57
ConfID: 4662949
CauseID: 1348594355
OtherID: 1348585223
JT: Microelectronics Reliability
MD: ,18,4,316,1978,Automated photomask inspection
DOI: 10.1016/0026-2714(78)90522-X(Journal) (4662949-N)
DOI: 10.1016/0026-2714(78)90529-2(Journal)