Report date: Nov 6,2024
Conflict count: 361874
Publisher: Pensoft Publishers
Title count: 9
Conflict count: 12


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Created: 2023-08-28 02:46:55
ConfID: 6923103
CauseID: 1587209614
OtherID: 1586924741
JT: Modern Electronic Materials
MD: Belov,9,2,69,2023,Comparison between optical and electrical data on hole concentration in zinc-doped p-GaAs
DOI: 10.3897/j.moem.9.109743(Journal) (6923103-N)
DOI: 10.3897/j.moem.9.2.109743(Journal)
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Created: 2023-08-28 02:45:36
ConfID: 6923102
CauseID: 1587209417
OtherID: 1586924932
JT: Modern Electronic Materials
MD: Feklistov,9,2,57,2023,Electron and hole injection barriers between silicon substrate and RF magnetron sputtered In2O3 : Er films
DOI: 10.3897/j.moem.9.109980(Journal) (6923102-N)
DOI: 10.3897/j.moem.9.2.109980(Journal)