Report date: Nov 6,2024
Conflict count: 361874
Publisher: SPIE - International Society for Optical Engineering
Title count: 2
Conflict count: 4


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Created: 2022-05-06 05:09:11
ConfID: 6482080
CauseID: 1528463465
OtherID: 1527345595
JT: Optical Engineering
MD: Stehlik,61,7,,2022,Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films
DOI: 10.1117/1.OE.61.7.070903(Journal) (6482080-N)
DOI: 10.1117/1.OE.61.7.071603(Journal)