Report date: Mar 26, 2024 Conflict count: 356923 Publisher: Elsevier Title count: 938 Conflict count: 15183 ========================================================== Created: 2012-02-15 15:53:57.0 ConfID: 4662949 CauseID: 1348594355 OtherID: 1348585223 JT: Microelectronics Reliability MD: null, 18 ,4,316,1978,Automated photomask inspection DOI: 10.1016/0026-2714(78)90522-X(Journal) (4662949-N ) DOI: 10.1016/0026-2714(78)90529-2(Journal) ========================================================== Created: 2012-02-15 16:05:26.0 ConfID: 4821937 CauseID: 1348614055 OtherID: 1348584132 JT: Microelectronics Reliability MD: null, 6 ,2,202,1967,Resistivity and structure of sputtered molybdenum films DOI: 10.1016/0026-2714(67)90237-5(Journal) (4821937-N ) DOI: 10.1016/0026-2714(67)90240-5(Journal)